Study of the theoretical failure model of the NPM-69-M microelectronic block. Международный научный журнал «Инженер», [S. l.], v. 3, n. 2, p. 48–51, 2025. DOI: 10.56143/3030-3893-2025-2-48-51. Disponível em: https://engineer.tstu.uz/index.php/engineer-tstu/article/view/75. Acesso em: 26 jul. 2026.