Study of the theoretical failure model of the NPM-69-M microelectronic block

Abstract

The article addresses the question of studying the paired axis control model of a microelectronic block, obtaining the numerical value of the operational failure intensity (EIO) of a microelectronic block, studying the theoretical model of failures, obtaining the eio numerical values of a microelectronic block. One of the most dynamically developing industries in the modern world is mirkroprotssesor and microelectronic systems. Important when processing information resources and exchanging information between the device and users, these systems play an important role. The hardware supply structure of these systems is enriched by a new integrated circuit and equipment day by day, in exchange for the rapid development of semiconductor technology. These tools and systems are the main technical component of the activities of most small and medium-sized industrial enterprises, as well as large industrial sectors that use modern work organization solutions. The introduction of similar systems into practice in the railway industry, which is calculated from such large industries, does not remain without contributing to the development of the industry. In particular, the issue of replacing electromagnetic relays with microelectronic devices, which were commissioned in the 60s of the last century in most of the railway lines currently in use in our country in railway automation and telemechanics systems, is considered in this article. To address these issues, NPM-69-m studied and analyzed the failure rate of the block under investigation, as well as the rate of qisim failure, which is twice as high as similar indicators of other components of the NPM-69-m microelectron block.